Fast electro‐thermal simulation of short‐circuit tests

COUPLET: Coupled Electrothermal Simulation

The aim of the project COUPLET (supported by Institut Farman) is to study the electrothermal effects of the degradation of the metallisation layer of power semiconductor dies. In this first technical report of the project, we describe our work of modeling and simulation of the behavior of a power transistor. The die is represented by four elementary transistors driven by a distributed gate sign...

An electrothermal stimulator for sensory tests.

Electrothermal simulation of superconducting nanowire avalanche photodetectors

Electro-thermal simulation of superconducting nanowire avalanche photodetectors Francesco Marsili, Faraz Najafi, Charles Herder, Karl K. Berggren Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, USA. Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628CJ Delft,...

Simulation of Topology Optimized Electrothermal Microgrippers

In this work, electrothermal microgrippers designed using topology optimization are modeled. The microgrippers are composed of two 5 μm-thick polysilicon actuators facing each other. The gap between the actuators are 2 μm in the initial state and the microgrippers are able to both fully close and further open this gap. The operation principle of the actuators is quite similar to that of a paral...

the washback effect of discretepoint vs. integrative tests on the retention of content in knowledge tests

در این پایان نامه تاثیر دو نوع تست جزیی نگر و کلی نگر بر به یادسپاری محتوا ارزیابی شده که نتایج نشان دهندهکارایی تستهای کلی نگر بیشتر از سایر آزمونها است